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Analysis of a Test Method for Delay Faults in NoC Interconnects
Jönköping University, School of Engineering, JTH, Computer and Electrical Engineering.
Tallinn Technical University.
Jönköping University, School of Engineering, JTH, Computer and Electrical Engineering.
Tallinn Technical University.
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2006 (Swedish)In: Proceedings of IEEE East-West Design & Test Workshop (EWDTW), Kharkov: Kharkov National University of Radio Electronics , 2006, p. 42-46Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Kharkov: Kharkov National University of Radio Electronics , 2006. p. 42-46
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Engineering and Technology
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URN: urn:nbn:se:hj:diva-6449ISBN: 9789666591244 (print)OAI: oai:DiVA.org:hj-6449DiVA, id: diva2:37269
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IEEE East-West Design & Test Workshop
Available from: 2007-08-02 Created: 2007-08-02 Last updated: 2011-08-10Bibliographically approved

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Bengtsson, TomasKumar, Shashi

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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More styles
Language
  • de-DE
  • en-GB
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  • nn-NO
  • nn-NB
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  • Other locale
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