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An improved method for delay fault testing of NoC interconnections
Jönköping University, School of Engineering, JTH, Computer and Electrical Engineering.
Jönköping University, School of Engineering, JTH, Computer and Electrical Engineering.
Tallinn Technical University.
Tallinn Technical University.
2006 (English)In: Date 06 Friday Workshop notes of Special Workshop on Future Interconnects and Networks on Chip, 2006Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2006.
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URN: urn:nbn:se:hj:diva-6444OAI: oai:DiVA.org:hj-6444DiVA, id: diva2:37264
Available from: 2007-08-02 Created: 2007-08-02

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Bengtsson, TomasKumar, Shashi

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CiteExportLink to record
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