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Answer-set programming as a new approach to event-sequence testing
Faculty of Engineering and Natural Sciences, Sabanci University, Orhanli, Tuzla, Turkey.
National Institute of Informatics, Hitotsubashi, Japan.
Institut föur Informationssysteme 184/3, Technische Universität Wien, Vienna, Austria.ORCID iD: 0000-0002-9902-7662
Institut föur Informationssysteme 184/3, Technische Universität Wien, Vienna, Austria.
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2011 (English)In: VALID 2011 - 3rd International Conference on Advances in System Testing and Validation Lifecycle, 2011, p. 25-34Conference paper, Published paper (Refereed)
Abstract [en]

In many applications, faults are triggered by events that occur in a particular order. Based on the assumption that most bugs are caused by the interaction of a low number of events, Kuhn et al. recently introduced sequence covering arrays (SCAs) as suitable designs for event sequence testing. In practice, directly applying SCAs for testing is often impaired by additional constraints, and SCAs have to be adapted to fit application-specific needs. Modifying precomputed SCAs to account for problem variations can be problematic, if not impossible, and developing dedicated algorithms is costly. In this paper, we propose answer-set programming (ASP), a well-known knowledge-representation formalism from the area of artificial intelligence based on logic programming, as a declarative paradigm for computing SCAs. Our approach allows to concisely state complex coverage criteria in an elaboration tolerant way, i.e., small variations of a problem specification require only small modifications of the ASP representation.

Place, publisher, year, edition, pages
2011. p. 25-34
Keywords [en]
Answer-set programming, Combinatorial interaction testing, Event-sequence testing, Coverage criteria, Covering arrays, Event sequence testing, New approaches, Problem specification, Small variations, Artificial intelligence, Logic programming, System theory, Life cycle
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:hj:diva-63575Scopus ID: 2-s2.0-84880216353ISBN: 9781612081687 (print)OAI: oai:DiVA.org:hj-63575DiVA, id: diva2:1838369
Conference
3rd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2011, 23-29 October 2011, Barcelona, Spain
Available from: 2024-02-16 Created: 2024-02-16 Last updated: 2024-02-16Bibliographically approved

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Oetsch, Johannes

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