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Binary pattern matching from a local dissimilarity measure
CReSTIC-URCA, IUT, Troyes Cedex, France.
CReSTIC-URCA, IUT, Troyes Cedex, France.ORCID iD: 0000-0002-9999-9197
CReSTIC-URCA, IUT, Troyes Cedex, France.
2010 (English)In: 2010 2nd International Conference on Image Processing Theory, Tools and Applications, IPTA 2010, IEEE, 2010, p. 417-420Conference paper, Published paper (Refereed)
Abstract [en]

This communication deals with finding the position of a reference shape in a given image. The proposed matcher is constructed from local dissimilarity maps. These maps allow to efficiently and robustly measure the differences between two images. It is shown an example that the matcher potentially returns less false-positives than a reference method (chamfer matching). This is possible as the local dissimilarity measure is symmetric, which makes it more robust to noise.We show that the proposed matcher is a generalization of the chamfer matching. It also allows fast computation times. A good robustness to noise is confirmed from presented simulations.

Place, publisher, year, edition, pages
IEEE, 2010. p. 417-420
Keywords [en]
Chamfer matching, Local dissimilarity, Pattern recognition, Template localization, Dissimilarity measures, Fast computation, Reference method, Imaging systems, Pattern matching, Image processing
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:hj:diva-60436DOI: 10.1109/IPTA.2010.5586784Scopus ID: 2-s2.0-78049489110ISBN: 9781424472482 (print)OAI: oai:DiVA.org:hj-60436DiVA, id: diva2:1759094
Conference
2010 2nd International Conference on Image Processing Theory, Tools and Applications, IPTA 2010, 7 July 2010 through 10 July 2010, Paris
Available from: 2023-05-24 Created: 2023-05-24 Last updated: 2023-05-24Bibliographically approved

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Landré, Jérôme

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  • de-DE
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  • nn-NB
  • sv-SE
  • Other locale
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Output format
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  • asciidoc
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