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Metropolitan innovation, firm size, and business survival in a high-tech industry
School of Public Policy, George Mason University, VA, United States.
Department of Geography and Earth Sciences, University of North Carolina at Charlotte, NC, United States.
Department of Geography and Earth Sciences, University of North Carolina at Charlotte, NC, United States.ORCID iD: 0000-0002-4101-4279
2014 (English)In: Small Business Economics, ISSN 0921-898X, E-ISSN 1573-0913, Vol. 43, no 3, p. 661-676Article in journal (Refereed) Published
Abstract [en]

This paper contributes to the growing body of business survival literature that focuses on regional determinants of the hazard faced by firms. Using parametric survival analysis, we test the effects of regional innovation on exit likelihood in the US computer and electronic product manufacturing during the 1992–2008 period. The novelty of our approach is in conditioning the effects of metropolitan innovation on firm size. Estimation results suggest a negative relationship between metropolitan patenting activity and survival of firms that started with 1–3 employees. This effect decreases if companies grow. Establishments with more than 4 employees at start-up are insensitive to metropolitan innovation, although size of firms that started with 4–9 employees improves their survival chances. These findings indicate that local knowledge spillovers do not translate into lower hazard. The negative relationship indicates either a creative destruction regime or decisions of entrepreneurs to shut down existing ventures in order to pursue other opportunities.

Place, publisher, year, edition, pages
Kluwer Academic Publishers, 2014. Vol. 43, no 3, p. 661-676
Keywords [en]
Business survival, Computer and electronic product manufacturing, Metropolitan innovation, Survival analysis
National Category
Economics
Identifiers
URN: urn:nbn:se:hj:diva-58269DOI: 10.1007/s11187-014-9550-zISI: 000341926400008Scopus ID: 2-s2.0-84894078787OAI: oai:DiVA.org:hj-58269DiVA, id: diva2:1689273
Available from: 2022-08-22 Created: 2022-08-22 Last updated: 2023-02-20Bibliographically approved

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Strumsky, Deborah

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