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Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
Jönköping University, School of Engineering, JTH. Research area Robust Embedded Systems. (Electronic System Design)
Jönköping University, School of Engineering, JTH, Computer and Electrical Engineering. Jönköping University, School of Engineering, JTH. Research area Robust Embedded Systems. (Electronic System Design)
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2008 (English)In: IET Computers and Digital Techniques, ISSN 1751-8601, Vol. 2, no 6, 445-460 p.Article in journal (Refereed) Published
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Stevenage: The Institution of Engineering and Technology , 2008. Vol. 2, no 6, 445-460 p.
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Computer Science Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:hj:diva-7252DOI: 10.1049/iet-cdt:20070048OAI: oai:DiVA.org:hj-7252DiVA: diva2:132418
Available from: 2008-12-18 Created: 2008-12-18 Last updated: 2010-02-05Bibliographically approved

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Bengtsson, TomasKumar, Shashi
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CiteExportLink to record
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