Cut topology optimization for linear elasticity with coupling to parametric nondesign domain regionsShow others and affiliations
2019 (English)In: Computer Methods in Applied Mechanics and Engineering, ISSN 0045-7825, E-ISSN 1879-2138, Vol. 350, p. 462-479Article in journal (Refereed) Published
Abstract [en]
We develop a density based topology optimization method for linear elasticity based on the cut finite element method. More precisely, the design domain is discretized using cut finite elements which allow complicated geometry to be represented on a structured fixed background mesh. The geometry of the design domain is allowed to cut through the background mesh in an arbitrary way and certain stabilization terms are added in the vicinity of the cut boundary, which guarantee stability of the method. Furthermore, in addition to standard Dirichlet and Neumann conditions we consider interface conditions enabling coupling of the design domain to parts of the structure for which the design is already given. These given parts of the structure, called the nondesign domain regions, typically represent parts of the geometry provided by the designer. The nondesign domain regions may be discretized independently from the design domains using for example parametric meshed finite elements or isogeometric analysis. The interface and Dirichlet conditions are based on Nitsche's method and are stable for the full range of density parameters. In particular we obtain a traction-free Neumann condition in the limit when the density tends to zero.
Place, publisher, year, edition, pages
Elsevier, 2019. Vol. 350, p. 462-479
Keywords [en]
Cut finite element method, Design and nondesign domain regions, Material distribution topology optimization, Elasticity, Mesh generation, Stabilization, Topology, Complicated geometry, Density parameters, Dirichlet condition, Interface conditions, Isogeometric analysis, Linear elasticity, Material distribution, Topology Optimization Method, Finite element method
National Category
Computational Mathematics
Identifiers
URN: urn:nbn:se:hj:diva-43449DOI: 10.1016/j.cma.2019.03.016ISI: 000468163500019Scopus ID: 2-s2.0-85063489165Local ID: ;JTHMaterialISOAI: oai:DiVA.org:hj-43449DiVA, id: diva2:1303765
2019-04-102019-04-102019-06-07Bibliographically approved